• Font Size:
  • A
  • A
  • A

Webinars

All Webinars

The Golden Formula To Get Positive Outcome From Visual Inspection Using AI

Join us for a Webinar on June 9, 2020 at Noon ET

The Golden Formula To Get Positive Outcome From Visual Inspection Using AIAI (Artificial Intelligence) and Deep Learning is one of the most lucrative skill sets both under COVID-19 and in a Post COVID-19 Era, where AI is needed to bring speed in a time of urgency, and contactless methods of operation in a time of social distance. NEC brings together our Visual Inspection Solution into the manufacturing world to create heightened product delivery through Quality excellence.  In order to harness this technology to expand visual inspections in manufacturing, you will need the golden formula containing: domain knowledge, big data, and deep learning of AI.

In this seminar we’ll explain how to eliminate your day to day quality inspection issues and leverage deep learning techniques to automate visual inspections by AI and detect hidden defects that are not detected by standard machine vision system.

 

All MCMA webinars are free educational resources for you.

 

 Register for Webinar


Exclusive Sponsor:

 NEC

Webinar Presenters

Hans Peter Graf

Hans Peter Graf, Head of Department, NEC Laboratories America
Hans Peter Graf is head of the machine learning research department at NEC Laboratories America in Princeton. The department develops machine learning algorithms and systems, as well as a range of applications in semantic text analysis, cognitive video interpretation and bio-medical analytics. Several products have resulted from this technology, such as the e-Pathologist, a system assisting pathologists with the interpretation of histological samples. Another product is a system for visual inspection that is based on algorithms developed by the department. Hans Peter received a PhD in physics from the Swiss Federal Institute of Technology in Zurich, Switzerland. He is author or coauthor of over 100 reviewed articles and some 50 issued patents. He is a Fellow of the IEEE and a member of the American Physical Society.

Himanshu Shekhar

Himanshu Shekhar, Solutions Architect, NEC Corporation of America
Himanshu Shekhar has around 20 years of experience in Analytics helping organization build cutting edge capability across various areas: predicting default, right asset allocation or redistribution of territory to optimize sales force. During his undergraduate and graduate studies, he applied AI to improve catalyst composition to improve CO-CO2 conversion and predict protein structure. He believes strongly in AI’s transformative power for business and is engaged in multiple initiative for NEC’s customers for better decisions, better products and optimized business processes. He holds a combined undergrad-grad degree from Indian Institute of Technology and Masters of Business Administration from Wharton Business School.


Browse By Products/Services Browse Companies